The CTS tests are designed to determine whether a given product conforms to a subset of the requirements defined in the I3C Specification v1.0. The scope of this first version of the CTS is intentionally limited, in order to meet time-to-market requirements imposed by the rapid adoption of I3C in the marketplace, focusing on:
1. SDR-only Devices without optional I3C capabilities,
2. All Master and Slave Error Detection and Recovery methods, and
3. Basic HDR Enter/tolerance/Restart/Exit are in scope, but HDR-DDR is under consideration.
Considering the CTS a living document, the Sensor WG plans to continue expanding the scope of the CTS through future revisions that eventually encompass all required and optional features of the I3C Specification.
The CTS tests are organized as Master device under test (DUT) and Slave DUT. Tests for each are presented in the order in which they appear in the I3C Specification, to simplify identification of pertinent detail between the two documents.