A standardized way to use functional interfaces for debug and test procedures
USB 2.0 Micro-B/-AB
Debug and test throughout the development life cycle
Testing devices enclosed in a product's final form factor
Testing small, very thin devices
Creating generic or company-specific testing tools
MIPI Narrow Interface for Debug and TestSM (MIPI NIDnTSM) defines a standardized way to use functional ports on a device for debug and test procedures. The specification makes it easier for developers to identify problems in complex designs to ensure high-quality products. It also reduces development costs because it alleviates the need for expensive, proprietary testing tools.
A key feature of MIPI NIDnT v1.2 is an innovative use of USB Type-C v1.2 "alternate modes" to facilitate debug and test over USB Type-C pins. The capability provides conveniences to developers in many device segments because USB Type-C is gaining popularity as a robust connector for small, thin devices such as smartphones, tablets and laptops as well as IoT, augmented reality and virtual reality products.
MIPI NIDnT v1.2 is versatile, offering designers the flexibility to perform debug and test over other interfaces that are widely used in mobile and mobile-influenced designs. Interfaces supported by the specification include USB 2.0 Micro-B/-AB, microSD, HDMI and DisplayPort.
Developers can benefit from MIPI NIDnT v1.2 conveniences throughout the development lifecycle. It supports debugging during the system design process, when space is not available on a board for a dedicated debug connector. It can also be used after products are on the market, when testing requires access to components that are enclosed within a sealed device.
Typical organizations that adopt MIPI NIDnT v1.2 include companies that want to build debug and testing tools for their own internal processes as well as companies that develop generic testing tools for SOC manufacturers, board developers and OEMs.
MIPI NIDnT v1.2 and the MIPI Discovery and Configuration Specification for Narrow Interface for Debug and Test v1.0SM (MIPI DisCo for NIDnT v1.0) complement each other. This is a standardized software tool that makes it possible for test device software to easily discover and configure the hardware debug and test capabilities enabled by MIPI NIDnT.
The version currently available for download is v1.2.1 (adopted June 2022), which adds references for MIPI I3C® in the informative sections, as well as inclusive terminology updates.
All MIPI debug and trace specifications, including MIPI NIDnT, are available for download and use by the public and the open source community. Members of the MIPI Alliance enjoy benefits including access to relevant licenses and opportunities to participate in development activities, interoperability workshops and other events. For information about MIPI Alliance membership, visit Join MIPI.
|Table 1 Summary of Test/Debug Capabilities Supported by NIDnT|
|Capability||Interface with Single-Ended Electricals||Interface with Differential Electricals|
|Basic Debug||2-pin (Min-Pin) Debug
||4-pin High-Speed Debug
|5-pin Legacy Debug
|6-pin Modified Legacy Debug
|User Defined||Vendor Defined Single-Ended||Vendor Defined Differential|