Using available ports on a device for end-product testing

Quick Facts

Fundamental Feature

A standardized way to use functional interfaces for debug and test procedures

Functional Interfaces Supported

USB Type-C™ New banner
USB 2.0 Micro-B/-AB
microSD
HDMI
DisplayPort

Use Cases

Debug and test throughout the development life cycle
System-on-chip testing
Testing devices enclosed in a product's final form factor
Testing small, very thin devices
Creating generic or company-specific testing tools

Industries

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Overview

MIPI Narrow Interface for Debug and TestSM (MIPI NIDnTSM) defines a standardized way to use functional ports on a device for debug and test procedures. The specification makes it easier for developers to identify problems in complex designs to ensure high-quality products. It also reduces development costs because it alleviates the need for expensive, proprietary testing tools.

A key feature of MIPI NIDnT v1.2 is an innovative use of USB Type-C v1.2 "alternate modes" to facilitate debug and test over USB Type-C pins. The capability provides conveniences to developers in many device segments because USB Type-C is gaining popularity as a robust connector for small, thin devices such as smartphones, tablets and laptops as well as IoT, augmented reality and virtual reality products. 

MIPI NIDnT v1.2 is versatile, offering designers the flexibility to perform debug and test over other interfaces that are widely used in mobile and mobile-influenced designs. Interfaces supported by the specification include USB 2.0 Micro-B/-AB, microSD, HDMI and DisplayPort.

Developers can benefit from MIPI NIDnT v1.2 conveniences throughout the development lifecycle. It supports debugging during the system design process, when space is not available on a board for a dedicated debug connector. It can also be used after products are on the market, when testing requires access to components that are enclosed within a sealed device.

Typical organizations that adopt MIPI NIDnT v1.2 include companies that want to build debug and testing tools for their own internal processes as well as companies that develop generic testing tools for SOC manufacturers, board developers and OEMs.

MIPI NIDnT v1.2 and the MIPI Discovery and Configuration Specification for Narrow Interface for Debug and Test v1.0SM (MIPI DisCo for NIDnT v1.0) complement each other. This is a standardized software tool that makes it possible for test device software to easily discover and configure the hardware debug and test capabilities enabled by MIPI NIDnT.

Note: MIPI NIDnT v1.2 is available only to MIPI Alliance members. For information about MIPI Alliance membership, visit Join MIPI

Table 1 Summary of Test/Debug Capabilities Supported by NIDnT
Capability Interface with Single-Ended Electricals Interface with Differential Electricals
Basic Debug 2-pin (Min-Pin) Debug
  • IEEE 1149.7
  • ARM(R) Serial Wire Debug (SWD)
  • UART
  • Vendor Defined Single-Ended Debug
4-pin High-Speed Debug
  • Vendor Defined Differential Debug
5-pin Legacy Debug
  • IEEE 1149.1
6-pin Modified Legacy Debug
  • Modified IEEE 1149.1 Standard with return clock (deprecated)
Trace Single-Ended Trace
  • MIPI Parallel Trace Interface (MIPI PTI)
  • Vendor Defined Single-Ended Trace
High-Speed Trace
  • MIPI High-Speed Trace Interface (MIPI HTI)
  • Vendor Defined Differential Trace
User Defined Vendor Defined Single-Ended Vendor Defined Differential