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      Mohamed Hafed, Ph.D., CEO at Introspect Technology

      5 min read

      Addressing the Challenges in High-Volume Production Testing of MIPI-Specification-Based Devices

      The latest trend for semiconductor device manufacturers is to add several high-speed MIPI® specification-based ports to a single device. This enables feature-rich implementations of imaging- and display-intensive applications, although it also poses...

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